#Activate vector magic 1.15 software

#Activate vector magic 1.15 software

Instrumentation and software necessary to take measurements, and to extract, validate and refine compact and behavioral Maury Microwave and AMCAD Engineering have partnered to release a turnkey design flow which includes the Measurement and modeling device characterization solution has never been more critical.

Market as a common organizational goal, the need for a highly-efficient turnkey component- to circuit- to system-level Modeling, and associated measurements, across multiple product levels (die-level, package-level, IC-level…). PUBLICATION HISTORY: MICROWAVE JOURNAL - MARCH 2016ĪBSTRACT:As companies become more vertically integrated, they take on the greater responsibilities of accurate and robust device Integrated, Turnkey Modeling & Measurement Systems AUTHOR: Steve Dudkiewicz, Maury Microwave Corp While load pull optimization can be addressed to refine the Harmonic impedances can be definedĪccordingly to the knowledge of the operating class addressed, Because of the well know theoreticĬonditions that enable optimum efficiency, this methodologyĬan also be used to avoid time consuming multi-harmonic load The voltage controlled current source plane, in order to enable Will be used to deembed the load pull measurements directly at The later measurements will be used to extractĪ linear model first. Starting their work using VNA based harmonic and timeĭomain load pull measurements, and S parameter The aim is to allow Power Amplifier designers Reference plane of the transistor, without using a complete Observe the RF waveforms at the drain source current Charbonniaud, T.Gasseling, AMCAD EngineeringĪBSTRACT:This paper presents a simple methodology to This application note explains the lesser known characterized SOLT calibration which drives the means to meet the objective of faster, accurate and wide-band calibrations.Ģ016 VNA Based Load Pull Harmonic Measurement De-embeddingĭedicated to Waveform Engineering AUTHORS: C. Hence the advent of Electronic calibration modules. While it may have been generally accepted all along, the need for faster and accurate calibrations have always been driven by operational efficiency requirements within organizations. The advantages and disadvantages of these methods have been covered in many documents since the 80's that explain the calibration theory.

The most commonly known methods are SOLT and TRL calibrations. Error correction techniques can be accomplished using several calibration methods. Therefore it has been one of the most extensively researched topics since the introduction of network analyzers. The accuracy of several advanced measurements depend on the accuracy of S parameter characterization. Buber, Maury Microwave CorpĪBSTRACT:S parameter error correction is the fundamental building block of the RF & microwave device characterization world. Improving Calibration Accuracy and Speed with Characterized Calibration Standards AUTHORS: P. Referring to the original amplifier scenario shown in Figure 1, quantifying measurement uncertainty can provide the confidence that the true performance of the DUT is reflected in the measurements, and the design will not pass one test and fail another. Identifying, quantifying and reducing the major sources of uncertainty in a test setup will improve the accuracy of the overall measurement. Uncertainty can help understanding how the various components in a measurement system impact the overall uncertainty of the DUT measurement. Uncertainty can aid in definitively verifying a VNA calibration before measuring a DUT.

Characterizing and quantifying measurement uncertainty is one such process to achieve the desired results. PUBLICATION HISTORY: Microwave Journal - October 2019ĪBSTRACT:As technologies evolve and requirements become more challenging, implementing processes that increase confidence in measurements and ensure accurate and reliable characterization-and product performance- are critical. 2019 Characterizing Uncertainty in S-Parameter Measurements AUTHORS: P.